
QIII ST Surface Particle Detector 0.1-5um
REDEFINE PRODUCTIVITY
Pentagon Technologies’ line of surface particle detectors are the standard in high technology industries for measuring and controlling surface contamination. Particles that accumulate on critical surfaces or products can reduce yield and reliability. To achieve optimal performance in particle sensitive manufacturing it is important to have a quantified metric for surface contamination. The QIII Surface Technology - QIII ST, uses an advanced, patented interface to re-suspend particulate from the surface and draw them through a particle detector. Use the QIII ST to find and eliminate the particles that cost you time and money.
BENEFITS
• Instant measurements of surface particulate
• Improve yield by reducing particles
• Minimize troubleshooting time by quickly identifying particle sources
• Monitor and set limits for particle density on incoming or outgoing materials
• Drive continuous improvement through establishing a surface particle baseline
• Test to standardized ISO 14644-9 classification of surface cleanliness
• Data integration into SPC systems.
• BKM Mode Option - to drive consistency in measurements and specifications
• Capture counted particles for analysis with optional Particle Analysis Module
• 21 CFR Part 11 Compliance for Lifescience applications

Sample Data
QIII ST Surface Particle Detector 0.1-5um


Sample Screen

